The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2025
Filed:
Nov. 18, 2021
Samsung Electronics Co., Ltd., Suwon-si, KR;
Young Jae Kim, Suwon-si, KR;
Kae Weon You, Hwaseong-si, KR;
Ji Ung Lee, Seoul, KR;
Jun Haeng Lee, Hwaseong-si, KR;
Kyoung Hoon Kang, Hwaseong-si, KR;
Young Hak Lee, Suwon-si, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
A deep learning device and system including the same is provided. The deep learning device comprising processing circuitry configured to determine whether a received image is abnormal using an anomaly detection model; merge at least some vectors extracted from the anomaly detection model; input, to a probability approximation model, principal components generated by a principal component analysis (PCA) to detect whether out of distribution (OOD) occurs in data of the received image; store a result of the determinations; and extract at least some the data in which the OOD occurs, as target labeling, using a target labeling extraction model when a rate of the data in which the OOD occurs is greater than or equal to a threshold value, wherein the anomaly detection model determines whether the received image is abnormal using the target labeling.