The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2025
Filed:
Dec. 16, 2024
Openai Opco, Llc, San Francisco, CA (US);
John V. Monaco, Foster City, CA (US);
OpenAI OpCo, LLC, San Francisco, CA (US);
Abstract
Sanitizing data can be a cumbersome task, particularly when the volume of data is large, the content is sensitive, and/or the type of sanitation requires contextual determinations. Sanitizing large amounts of data is tedious and may often require highly trained personnel with clearances and/or other qualifications. In the systems and methods of the present disclosure, language models (LMs) are used to solve these and other technical issues with tools that may allow sanitizing data easily, with high versatility, context awareness, and/or low demand for computational resources. In particular, some of the disclosed systems and methods use a first language model and a second language model (being less resource-intensive than the first language model) to generate sanitized output data with improved efficiency and accuracy. This dual-model approach ensures that sensitive information is handled appropriately while optimizing computer resource usage.