The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2025
Filed:
Aug. 29, 2017
Truvalue Labs, Inc., San Francisco, CA (US);
Gregory Bala, Morgan Hill, CA (US);
Sebastian Brinkmann, San Francisco, CA (US);
Hendrik Bartel, San Francisco, CA (US);
James P. Hawley, Oakland, CA (US);
Philip Kim, San Fransisco, CA (US);
Yang Ruan, Oakland, CA (US);
Mark Strehlow, San Fransisco, CA (US);
Faithlyn A. Tulloch, San Fransisco, CA (US);
Truvalue Labs, Inc., San Francisco, CA (US);
Abstract
Systems and methods are provided for identifying meta-events. A plurality of event items are received over a given period of time. The plurality of event items are analyzed to determine one or more areas of interests. One or more characteristics of the plurality of events items is measured. The measured number of event items within the particular area of interest within the given time period are compared against a measured number of even items within the particular area of interest within a previous time period. It is determined that a meta-event has occurred when the difference between the measured number of event items within the particular area of interest compared to the measured number of items within the particular area of interest within a previous time period exceeds a threshold measure of event items.