The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2025

Filed:

Feb. 29, 2024
Applicant:

Sap SE, Walldorf, DE;

Inventors:

Andreas Amler, Heidelberg, DE;

Paul Willems, Heidelberg, DE;

Till Merker, Sandhausen, DE;

Assignee:

SAP SE, Walldorf, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/22 (2019.01); G06F 16/2455 (2019.01);
U.S. Cl.
CPC ...
G06F 16/2282 (2019.01); G06F 16/221 (2019.01); G06F 16/2228 (2019.01); G06F 16/24556 (2019.01);
Abstract

A method for performing a multi-fragment index scan operation included in a query pipeline of a query accessing a database table may include performing an index scan on a first chunk of a first fragment of the database table and a second chunk of a second fragment of the database table. A first output of the index scan on the first chunk of the first fragment of the database table and a second output of the index scan on the second chunk of the second fragment of the database table may be merged to generate a partial result set for ingestion by a next operation in the query pipeline. The multi-fragment index scan operation may continue with index scans on subsequent chunks of the first fragment and second fragment of the database table. Related systems and computer program products are also provided.


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