The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2025
Filed:
Jan. 30, 2024
Institute of Geology and Geophysics, Chinese Academy of Sciences, Beijing, CN;
Fei Tian, Beijing, CN;
Qingyun Di, Beijing, CN;
Wenhao Zheng, Beijing, CN;
Yongyou Yang, Beijing, CN;
Wenjing Cao, Beijing, CN;
Abstract
The present invention is in the field of geological measurement, and particularly relates to a method and system for intelligent removal of multi-dimensional logging data outliers, aiming to solve the problem that it is difficult to achieve stable parameter acquisition in the drilling process when there are more outliers in the prior art. The present invention comprises: acquiring a multi-dimensional logging curve; obtaining two-dimensional logging curve data by using the Umap dimensionality reduction algorithm to perform dimensionality reduction; establishing a first data point index of the multi-dimensional logging curve and the two-dimensional logging curve data; obtaining valid logging data by processing outliers with an isolation forest algorithm based on the two-dimensional logging curve data; acquiring a second data point index based on the first data point index and valid logging data; finding marked data points where the second data point index exists in the multi-dimensional logging curve data.