The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2025

Filed:

Jan. 18, 2022
Applicant:

Optum, Inc., Minnetonka, MN (US);

Inventors:

Daniel G. Mccreary, St. Louis Park, MN (US);

Joshua A. Meekhof, Grand Rapids, MI (US);

Assignee:

OPTUM, INC., Minnetonka, MN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/21 (2019.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 16/211 (2019.01); G06N 20/00 (2019.01);
Abstract

Various embodiments provide methods, apparatus, systems, computing entities, and/or the like, for recommending and/or defining cross-schema mappings, or a mapping from a data element type of a first schema to one of a second schema. In one example embodiment, a method is provided. The method includes identifying a plurality of canonical data element types belonging to a canonical schema and an external data element type belonging to an external schema. The method includes obtaining a multi-dimensional representation for each data element type and determining a predicted similarity score for each canonical data element type using comparison results from a mapper machine learning model. The method further includes generating a recommendation data object indicating one or more mappings between the external data element type and a selected subset of the plurality of canonical data element types, the subset selected according to predicted similarity score.


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