The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2025
Filed:
Jan. 18, 2024
Dell Products L.p., Round Rock, TX (US);
Kuolin Hua, Natick, MA (US);
Michael Scharland, Franklin, MA (US);
Jiahui Wang, Framingham, MA (US);
Peng Yin, Southborough, MA (US);
Sean Hu, Westborough, MA (US);
Daohong Wang, Newton, MA (US);
Dell Products L.P., Round Rock, TX (US);
Abstract
A method comprising: detecting a storage device failure in a storage array, the storage array including a plurality of storage devices, the storage device failure being a failure of one or more of the plurality of storage devices; wherein: the plurality of storage devices are configured to implement a supergroup including a plurality of subgroups; identifying ones of the plurality of subgroups that are affected by the storage device failure; and rebuilding the identified subgroups, wherein: (A) when a count of failed storage device is less than a first threshold, each of the identified subgroups is rebuilt based only on subgroup parity components for the subgroup without the use of supergroup parity components, and (B) when the count of failed storage devices is between the first threshold and the second threshold, each of the identified subgroups is rebuilt based on both subgroup and supergroup parity components.