The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2025
Filed:
May. 20, 2021
Leica Instruments (Singapore) Pte. Ltd., Singapore, SG;
Tushar Krishnan, Singapore, SG;
Leica Instruments (Singapore) Pte Ltd., Singapore, SG;
Abstract
Examples relate to a microscope system () and to a corresponding system (), method and computer program for a microscope system. The system comprises one or more processors () and one or more storage devices (). The system is configured to determine a quality indicator of a quality of image data of a fluorescence imaging sensor () of a microscope () of the microscope system. The system is configured to identify, for one or more user settings of the microscope, a range of values that are suitable in view of the quality indicator. The system is configured to control a change of the one or more user settings based on the range of values that are suitable in view of the quality indicator.