The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2025
Filed:
Mar. 29, 2022
Nikon Corporation, Tokyo, JP;
Satoshi Ikeda, Yokohama, JP;
Naoki Fukutake, Tokyo, JP;
NIKON CORPORATION, Tokyo, JP;
Abstract
A microscope device comprises an illumination optical system for illuminating a sample, a detection optical system for receiving light from the sample, a detector for detecting the light from the sample via the detection optical system and outputting a detection signal of the light, a data processor for generating at least one of a three-dimensional refractive index distribution and a two-dimensional phase distribution in the sample based on the detection signal of the light output from the detector, and a modulation element group that is provided at a position of a pupil or a position conjugate with the pupil in only the illumination optical system, and has light transmittance changing continuously within a surface of the pupil or within a surface conjugate with the pupil.