The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2025

Filed:

Dec. 18, 2024
Applicant:

Siemens Healthineers Ag, Forchheim, DE;

Inventors:

Dieter Ritter, Fuerth, DE;

Ludwig Eberler, Neumarkt.i.d.OPf., DE;

Assignee:

SIEMENS HEALTHINEERS AG, Forchheim, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01); G01R 33/385 (2006.01); G01R 33/48 (2006.01); G01R 33/54 (2006.01); G01R 33/565 (2006.01);
U.S. Cl.
CPC ...
G01R 33/543 (2013.01); G01R 33/3856 (2013.01); G01R 33/4804 (2013.01); G01R 33/56518 (2013.01);
Abstract

A computer-implemented method for estimating an influence of a magnetic resonance tomography sequence on at least one component in or on an examination tunnel of a magnetic resonance tomography system, wherein the method comprises inputting at least one gradient waveform of the magnetic resonance tomography sequence into a temperature model; calculating an increase in temperature caused by an application of the magnetic resonance tomography sequence in the at least one component using the temperature model, the temperature model configured to calculate the increase in temperature based on an estimation of eddy currents induced by the at least one gradient waveform in the at least one component; and outputting at least one of the calculated increase in temperature or a temperature achieved by the increase in temperature.


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