The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2025
Filed:
Aug. 09, 2022
Electric Power Science & Research Institute of State Grid Tianjin Electric Power Company, Tianjin, CN;
State Grid Tianjin Electric Power Company, Tianjin, CN;
Shengchen Fang, Tianjin, CN;
Yang Yu, Tianjin, CN;
Weibo Li, Tianjin, CN;
Pengxian Song, Tianjin, CN;
Chun He, Tianjin, CN;
Chi Zhang, Tianjin, CN;
Qinghua Tang, Tianjin, CN;
Longji Li, Tianjin, CN;
Chunhui Zhang, Tianjin, CN;
Songyuan Li, Tianjin, CN;
Fei Lu, Tianjin, CN;
Lin Li, Tianjin, CN;
Lei Yang, Tianjin, CN;
Xiaoguang Wang, Tianjin, CN;
Xuliang Zhu, Tianjin, CN;
Minghui Duan, Tianjin, CN;
Haoming Wang, Tianjin, CN;
Wei Fan, Tianjin, CN;
Abstract
The present disclosure provides a defect detection method and apparatus for a cushion layer of a cable, a device, and a storage medium. The method includes: obtaining specification parameters of a corrugated sheath of a to-be-detected cable, calculating a first volume of a cushion layer without deformation and a second volume of a deformed portion of the cushion layer when the cushion layer is deformed under stress, and calculating a stressed-state deformation ratio of the cushion layer based on the first volume and the second volume; obtaining a voltage, a current, an electrode area, an electrode distance, and an initial electrode distance of the cushion layer when the stressed-state deformation ratio is reached, and calculating volume resistivity of the cushion layer; and comparing the volume resistivity with a preset evaluation parameter to obtain a defect detection result of the cushion layer.