The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2025

Filed:

May. 10, 2023
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventors:

Jose Fortes, Madrid, ES;

Juan-Angel Anton, Munich, DE;

Vincent Abadie, Hoehenschaeftlarn, DE;

Adrian Cardalda Garcia, Munich, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/318 (2015.01); G01R 29/10 (2006.01);
U.S. Cl.
CPC ...
G01R 29/105 (2013.01); H04B 17/318 (2015.01);
Abstract

The present disclosure relates to a method for total isotropic sensitivity, TIS, testing of a user equipment, UE. The method includes forwarding a first test signal towards the UE, wherein the first test signal is forwarded from a number of spherical coordinates around the UE; recording a respective RSS value; forwarding a second test signal towards the UE from the spherical coordinate; recording further RSS values for each of the different power levels of the second rest signal; calculating a linearization pattern which relates the further RSS values to the corresponding power levels of the second test signal; calculating a combined RSS value based on the RSS values recorded by the n receiver branches at the spherical coordinate in response to the first test signal; determining an equivalent isotropic sensitivity, EIS, value of the UE for the spherical coordinate; and calculating a EIS value for additional spherical coordinate(s).


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