The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2025

Filed:

Mar. 15, 2021
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Stergios Roumeliotis, Los Altos Hills, CA (US);

Oleg Naroditsky, San Francisco, CA (US);

Connie Wu, Menlo Park, CA (US);

Daniel C. Byrnes, Redwood City, CA (US);

Kuen-Han Lin, Mountain View, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01P 15/18 (2013.01); G01S 17/08 (2006.01); G01S 17/89 (2020.01);
U.S. Cl.
CPC ...
G01P 15/18 (2013.01); G01S 17/08 (2013.01); G01S 17/89 (2013.01);
Abstract

Various implementations disclosed herein include devices, systems, and methods that localize a device based on detecting planes in depth data acquired by the device. For example, an example process may include detecting first plane data in first sensor data acquired by a sensor at a first viewpoint location in a physical environment, detecting second plane data in second sensor data acquired by the sensor at a second viewpoint location in the physical environment, determining that the first plane data and the second plane data correspond to a same plane based on comparing the first plane data with the second plane data, and determining a spatial transformation between the first viewpoint location and the second viewpoint location based on the first plane data and the second plane data.


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