The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2025
Filed:
Dec. 02, 2019
Applicant:
Polymer Technology Systems, Inc., Whitestown, IN (US);
Inventors:
Joseph P. Joyce, Lafayette, IN (US);
Gary Grubbs, Whitestown, IN (US);
Christopher A. Dailey, Whitestown, IN (US);
Assignee:
Polymer Technology Systems, Inc., Whitestown, IN (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 33/72 (2006.01); G01N 1/44 (2006.01); G01N 27/327 (2006.01); G01N 33/49 (2006.01); H01B 1/02 (2006.01); B01L 3/00 (2006.01);
U.S. Cl.
CPC ...
G01N 33/723 (2013.01); G01N 1/44 (2013.01); G01N 27/3272 (2013.01); G01N 33/4915 (2013.01); H01B 1/02 (2013.01); B01L 3/502 (2013.01); B01L 2300/0825 (2013.01); B01L 2300/18 (2013.01); B01L 2400/00 (2013.01); G01N 2333/805 (2013.01);
Abstract
A system for testing for an analyte includes a test strip. The test strip includes a test strip detection conductor. The test strip includes a first flow path, the first flow path including a heating area, the test strip detection conductor in the heating area, the test strip detection conductor configured to be activated to heat a sample in the heating area.