The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2025
Filed:
Aug. 03, 2022
Baker Hughes Holdings Llc, Houston, TX (US);
Eberhard Neuser, Wunstorf, DE;
Alex Sawatzky, Wunstorf, DE;
Baker Hughes Holdings LLC, Houston, TX (US);
Abstract
A method for inspecting an object using CT is provided. In an embodiment, the method can include providing an object for an inspection. The object can be provided on a base configured to rotate the object. The method can also include acquiring a first plurality of inspection data characterizing the object during rotation through a first scan sector. The first plurality of inspection data can be acquired by a first inspection chain. The method can further include acquiring a second plurality of inspection data characterizing the object during rotation through a second scan sector. The second plurality of inspection data can be acquired by a second inspection chain. The method can also include providing the first plurality of inspection data and the second plurality of inspection data. Related systems, apparatuses, and non-transitory computer readable mediums are also provided.