The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2025
Filed:
Aug. 01, 2023
Shimadzu Corporation, Kyoto, JP;
Hiroaki Tsushima, Kyoto, JP;
Ryuji Sawada, Kyoto, JP;
Shimadzu Corporation, Kyoto, JP;
Abstract
An X-ray imaging system is configured to acquire first and second images from a teacher X-ray image including an inspection target. Discrimination information to discriminate at least one of an area of the inspection target in the first and second images, and an area of a defect part is acquired. Machine learning for producing a learned model is performed by using input teacher data sets based on the first and second images, and output teacher data sets based on the discrimination information.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile