The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2025
Filed:
Jan. 03, 2023
Rapiscan Holdings, Inc., Hawthorne, CA (US);
Dan-Cristian Dinca, Chelmsford, MA (US);
Rapiscan Holdings, Inc., Hawthorne, CA (US);
Abstract
The specification discloses methods of adjusting calibration data in an X-ray inspection system. Calibration data is initially generated. X-ray scan images of a cargo container are then acquired. Each of the X-ray scan images are segmented into regions of interest, where the regions of interest volumetrically encompass a known material or a material corresponding to a known HS code. Using the calibration data, first data indicative of Zeff of each of the regions of interest are determined. The first data is compared with second data indicative of known Zeff corresponding to the known materials and/or HS codes. The calibration data is then adjusted to generate a second calibration data if the first and second data differ significantly. The calibration data is replaced by the second calibration data in the memory.