The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2025
Filed:
Dec. 09, 2020
Agco Corporation, Duluth, GA (US);
Kevin J. Hamilton, Newton, KS (US);
Patrick Kendrick, Hesston, KS (US);
AGCO Corporation, Duluth, GA (US);
Abstract
A baler includes a near-infrared testing system configured to receive near-infrared radiation reflected by plant material in a bale and to analyze the near-infrared radiation and generate evaluation data reflecting one or more properties of the plant material. The near-infrared testing system is calibrated using a calibration sample at a calibration temperature. A temperature sensor measures a sample temperature of a crop sample of the plant material. A computer receives and combines the evaluation data of the plant material and a temperature-difference offset based on the difference in the sample temperature of the crop sample and the calibration temperature to produce overall temperature-compensated evaluation data reflecting one or more overall property values for the bale, and assign the overall temperature-compensated evaluation data to the at least one bale of the plurality of bales.