The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2025
Filed:
Jun. 01, 2023
Gba Branch of Aerospace Information Research Institute, Chinese Academy of Sciences, Guangdong, CN;
Zhenyou Wang, Guangzhou, CN;
Bi-Xiao Wang, Guangzhou, CN;
Mengyao Guo, Guangzhou, CN;
Guangyou Fang, Guangzhou, CN;
Abstract
Disclosed is a time-resolved spectrum rapid measurement system and method, the system including a pulse laser module, a sample stage module, a control computer module, a detector module, a spectrometer module, and a multi-path delay module. The multi-path delay module is configured to split the signal light produced by the samples in the sample stage module to form a plurality of optical paths; add a different optical distance in each optical path to extend the time for the signal light produced by the samples to reach a detector; and make the time for the signal light in each optical path to reach the detector different, to realize multi-path delay. By providing a multi-path delay module in the system, the present disclosure can measure the spectra of a plurality of delay windows in parallel, improving the measurement speed of time-resolved spectra while reducing the measurement error.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile