The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2025
Filed:
Jun. 09, 2022
Applicant:
Kokusai Keisokuki Kabushiki Kaisha, Tama, JP;
Inventors:
Sigeru Matsumoto, Tokyo, JP;
Hiroshi Miyashita, Tokyo, JP;
Kazuhiro Murauchi, Tokyo, JP;
Kiyoaki Haneishi, Tokyo, JP;
Assignee:
KOKUSAI KEISOKUKI KABUSHIKI KAISHA, Tama, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M 7/08 (2006.01); G01N 3/30 (2006.01);
U.S. Cl.
CPC ...
G01N 3/30 (2013.01); G01M 7/08 (2013.01);
Abstract
An impact test device includes a base, a dolly capable of traveling with a test piece placed thereon, and a fall preventing structure configured to prevent the test piece from falling over. The fall preventing structure includes a first section independent of the dolly The first section is provided so as to be movable in a traveling direction of the dolly with respect to the base.