The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2025

Filed:

Aug. 24, 2021
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Yutaka Yano, Tokyo, JP;

Hiroshi Kawakami, Tokyo, JP;

Makoto Saitoh, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 11/08 (2006.01); G01H 17/00 (2006.01); G01M 5/00 (2006.01); G01M 99/00 (2011.01);
U.S. Cl.
CPC ...
G01M 11/085 (2013.01);
Abstract

In order to provide a mechanism which predicts a risk of future failure occurrence, by using fiber optic sensing, this failure prediction system comprises: a sensing function unit which acquires the environmental information detected by the optical fiber; an event classification function unit which classifies, by type, events occurring at each position of the object indicated by the environmental information, on the basis of event classification conditions; and a failure occurrence risk calculation unit having, in advance, one or more failure models obtained by modeling a physical mechanism that leads to a malfunction in the object, wherein the failure occurrence risk calculation unit calculates a failure occurrence risk in each object by the mechanism, and outputs the accumulated result as a risk or availability.


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