The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2025

Filed:

Oct. 28, 2020
Applicant:

Arizona Board of Regents on Behalf of the University of Arizona, Tucson, AZ (US);

Inventors:

Michael Hart, Tucson, AZ (US);

Lennon Reinhart, Tucson, AZ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 9/00 (2006.01); G02B 27/14 (2006.01);
U.S. Cl.
CPC ...
G01J 9/00 (2013.01); G02B 27/14 (2013.01);
Abstract

Methods, devices and systems are described that enable improved determination of wavefront errors associated with light traveling through turbulent media, such as through the atmosphere. The described systems use a Rayleigh-Raman polychromatic laser guide star (RRPLGS) to measure the tilt at the wavelength of observation by making use of the dispersion of the refractive index of air and differential tilt measurements at multiple combinations of wavelengths based on the Rayleigh and Raman back-scattered light. The described RRPLGS systems have a number of advantages, including scalability of returned flux and flexibility in selection of short wavelengths, allowing for a combination of multiple tilt measurements, and enabling characterization of the turbulent media without relying on photons from the object of interest.


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