The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2025
Filed:
Jun. 21, 2022
Temperature measurement calibration method without interference of shutter of thermal imaging module
National Chung Shan Institute of Science and Technology, Taoyuan, TW;
Shiang-Feng Tang, Taoyuan, TW;
Shun-Lung Yen, Taoyuan, TW;
Kuo-Jen Chang, Taoyuan, TW;
Hsin-Chang Chen, Taoyuan, TW;
NATIONAL CHUNG SHAN lNSTITUTE OF SCIENCE AND TECHNOLOGY, Taoyuan, TW;
Abstract
A temperature measurement calibration method without interference of a shutter of a thermal imaging module comprises steps: at a temperature of a core chip of a thermal imaging module, obtaining a response value generated by measuring a blackbody temperature after the shutter is started at a frame time; performing a linear regression analysis of the response value to obtain a correction response value equation; inputting the response value into the correction response value equation; and obtaining a correction response value of measuring the blackbody temperature.