The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2025

Filed:

Nov. 27, 2023
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventors:

Tomoyo Tao, Kyoto, JP;

Tomoki Sasayama, Kyoto, JP;

Ryuta Shibutani, Kyoto, JP;

Atsuhiko Otaguro, Kyoto, JP;

Fumiya Katsutani, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/44 (2006.01); G01J 3/02 (2006.01); G01J 3/10 (2006.01);
U.S. Cl.
CPC ...
G01J 3/44 (2013.01); G01J 3/0202 (2013.01); G01J 3/0208 (2013.01); G01J 3/021 (2013.01); G01J 3/108 (2013.01);
Abstract

An infrared Raman device is capable of switching and performing Raman measurement and first infrared measurement on a sample. The infrared Raman device includes an objective lens for Raman measurement; a first observation lens for infrared measurement; a laser light source that generates laser light; a first infrared light source that generates first infrared light; and a mirror. The mirror is disposed at time of the Raman measurement to reflect the laser light to cause the laser light to pass through the objective lens for Raman measurement and reflect Raman light generated from the sample by the laser light that passes through the objective lens for Raman measurement and radiated to the sample. The Raman light passes back through the objective lens for Raman measurement.


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