The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2025

Filed:

Feb. 26, 2020
Applicant:

Renishaw Plc, Wotton-under-Edge, GB;

Inventors:

John Dardis, Stroud, GB;

Ceri Brown, Plaisance-du-Touch, FR;

Jonathan Mansell, Bristol, GB;

Assignee:

RENISHAW PLC, Wotton-Under-Edge, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B22F 10/85 (2021.01); B22F 10/28 (2021.01); B22F 10/366 (2021.01); B22F 12/44 (2021.01); B22F 12/45 (2021.01); B22F 12/47 (2021.01); B22F 12/49 (2021.01); B22F 12/90 (2021.01); B33Y 10/00 (2015.01); B33Y 30/00 (2015.01); B33Y 50/02 (2015.01);
U.S. Cl.
CPC ...
B22F 10/85 (2021.01); B22F 10/28 (2021.01); B22F 10/366 (2021.01); B22F 12/44 (2021.01); B22F 12/45 (2021.01); B22F 12/47 (2021.01); B22F 12/49 (2021.01); B22F 12/90 (2021.01); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B33Y 50/02 (2014.12);
Abstract

A method of aligning an on-axis melt pool sensor in an additive manufacturing apparatus. The method includes scanning a first laser beam along a first scan path across a working surface using a first optical train to generate a melt pool along the first scan path and scanning a field of view of an on-axis sensor along a second scan path across the working surface using a second optical train for steering a second laser beam. The first and second scan paths intersect. An adjustment to be made to an alignment of the field of view of the on-axis sensor with an optical axis of the second optical train is determined from a variation in the signal generated by the on-axis sensor as the field of view is scanned along the second scan path.


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