The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2025

Filed:

Oct. 08, 2021
Applicant:

Sms Group Gmbh, Düsseldorf, DE;

Inventors:

David Hüsgen, Korschenbroich, DE;

Michael Büsch, Viersen, DE;

Assignee:

SMS group GmbH, Düsseldorf, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B21C 51/00 (2006.01); B21C 23/21 (2006.01); B21C 31/00 (2006.01); B21J 9/20 (2006.01); B21J 13/04 (2006.01); B30B 15/04 (2006.01);
U.S. Cl.
CPC ...
B21C 51/00 (2013.01); B21C 23/215 (2013.01); B21C 31/00 (2013.01); B21J 9/20 (2013.01); B21J 13/04 (2013.01); B30B 15/041 (2013.01);
Abstract

A method for monitoring and changing the position of at least one component, more particularly a running bar, slidingly guided within a press frame between abutments of the press frame is disclosed. A central alignment of the component within the press frame is continuously measured and the alignment of the component within the press frame is corrected as a function of the acquired measurement result by preferably automatically adjustable guide elements of the sliding guides of the press. The central alignment of the slidingly guided component within the press frame is measured by the sensing of the location of at least one, preferably two, reference points of the slidingly guided component preferably in a plane extending perpendicularly to the longitudinal center axis of the press. A press having automatically adjustable guide elements and means for controlling the guide elements as a function of the measured position of the component.


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