The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2025
Filed:
Dec. 27, 2022
Siemens Healthcare Gmbh, Erlangen, DE;
Marcus Radicke, Veitsbronn, DE;
Ralf Nanke, Neunkirchen am Brand, DE;
Steffen Kappler, Effeltrich, DE;
Thomas Weber, Hausen, DE;
Ferdinand Lueck, Erlangen, DE;
Ludwig Ritschl, Buttenheim, DE;
Anja Fritzler, Erlangen, DE;
SIEMENS HEALTHINEERS AG, Forchheim, DE;
Abstract
A method for controlling an FFS X-ray system comprises: simulating a beam geometry of the X-ray beam at a specified FFS deflection onto the detector during recording of a projection image; determining whether cross-radiation is present in a region around the detector by the simulated beam geometry of the X-ray beam; generating FFS control data for the recording of the projection image, wherein the FFS control data either (i) causes FFS deflection that is reduced relative to the specified FFS deflection for the recording of the projection image in the event of the cross-radiation being present for the recording of the projection image or (ii) causes the specified FFS deflection otherwise; repeating the simulating, the determining and the generating FFS control data for at least one further recording of a projection image; and generating a control data set including the FFS control data, for controlling an FFS X-ray system.