The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2025
Filed:
Mar. 05, 2020
Topcon Corporation, Tokyo, JP;
Hitoshi Shimizu, Tokyo, JP;
Kazuhiro Ohmori, Tokyo, JP;
TOPCON CORPORATION, Tokyo, JP;
Abstract
A slit lamp microscope according to some aspect examples includes an illumination system and photographing system. The illumination system projects slit light onto an anterior segment of a subject's eye. The photographing system includes an optical system and an image sensor. The optical system directs light from the anterior segment onto which the slit light is being projected. The image sensor includes a light detecting surface that receives the light directed by the optical system. Further, a subject plane, a principal plane of the optical system, and the light detecting surface are arranged so as to satisfy a Scheimpflug condition. Here, the subject plane includes a focal point of the illumination system in which a position of the focal point is shifted on account of a refractive index of a tissue of the anterior segment.