The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2025

Filed:

Sep. 30, 2021
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Yoshihiko Iwase, Kanagawa, JP;

Osamu Sagano, Tokyo, JP;

Hiroki Uchida, Tokyo, JP;

Juun Horie, Tokyo, JP;

Riuma Takahashi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/12 (2006.01); A61B 3/00 (2006.01); A61B 3/10 (2006.01);
U.S. Cl.
CPC ...
A61B 3/1233 (2013.01); A61B 3/0058 (2013.01); A61B 3/102 (2013.01);
Abstract

An apparatus includes an obtaining unit configured to obtain, using an optical coherence tomography, an analysis map for a disk and an analysis map for a macular area, which are analysis results of three-dimensional data obtained by capturing an image of a region of a fundus of a subject's eye that includes the disk and the macular area, and a control unit configured to cause a display unit to display side by side a two-dimensional image of the region including the disk and the macular area, the analysis map for the optic disk, and the analysis map for the macular area.


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