The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 05, 2025

Filed:

Apr. 04, 2022
Applicant:

Omnivision Technologies, Inc., Santa Clara, CA (US);

Inventor:

Victor Lenchenkov, Sunnyvale, CA (US);

Assignee:

OmniVision Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 5/30 (2006.01); G02B 5/18 (2006.01); H04N 23/71 (2023.01); H04N 23/74 (2023.01); H10F 39/00 (2025.01); H10F 39/18 (2025.01);
U.S. Cl.
CPC ...
H10F 39/806 (2025.01); G02B 5/1814 (2013.01); G02B 5/3058 (2013.01); H04N 23/71 (2023.01); H04N 23/74 (2023.01); H10F 39/18 (2025.01); G02B 2207/101 (2013.01);
Abstract

An image sensor has an array of a tiling pattern of cells, each cell having at least one spiral nanowire circular polarizer formed of nanowires less than 80 nanometers in width; and photodiodes to receive incoming light form the circular polarizer. In embodiments, the polarizer is a descending spiral circular polarizer including at least four nanowires each about fifty nanometers wide at successive levels in the polarizer. In other embodiments, the circular polarizer comprises a flat spiral nanowire of width about seventy nanometers width, the flat spiral nanowire interrupted by cuts, disposed over multiple photodiodes to analyze a diffraction pattern from the polarizer.


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