The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 05, 2025

Filed:

Mar. 22, 2024
Applicant:

Semiconductor Energy Laboratory Co., Ltd., Atsugi, JP;

Inventors:

Shunpei Yamazaki, Tokyo, JP;

Naoki Okuno, Kanagawa, JP;

Tetsuya Kakehata, Kanagawa, JP;

Hiroki Komagata, Kanagawa, JP;

Yuji Egi, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H10D 30/67 (2025.01); H01L 21/02 (2006.01); H10D 84/01 (2025.01); H10D 84/03 (2025.01); H10D 99/00 (2025.01); H10D 30/01 (2025.01);
U.S. Cl.
CPC ...
H10D 30/6757 (2025.01); H01L 21/02274 (2013.01); H01L 21/0228 (2013.01); H01L 21/02565 (2013.01); H10D 30/67 (2025.01); H10D 84/0128 (2025.01); H10D 84/038 (2025.01); H10D 99/00 (2025.01); H10D 30/031 (2025.01);
Abstract

A manufacturing method of a semiconductor device includes the forming a first oxide over a substrate; depositing a first insulator over the first oxide; forming an opening reaching the first oxide in the first insulator; depositing a first oxide film in contact with the first oxide and the first insulator in the opening; depositing a first insulating film over the first oxide film by a PEALD method; depositing a first conductive film over the first insulating film; and removing part of the first oxide film, part of the first insulating film, and part of the first conductive film until a top surface of the first insulator is exposed to form a second oxide, a second insulator, and a first conductor. The deposition of the first insulating film is performed while the substrate is heated to higher than or equal to 300°.


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