The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 05, 2025

Filed:

Aug. 15, 2019
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Peng Cheng, Beijing, CN;

Karthika Paladugu, San Diego, CA (US);

Gavin Bernard Horn, La Jolla, CA (US);

Punyaslok Purkayastha, San Diego, CA (US);

Masato Kitazoe, Tokyo, JP;

Ozcan Ozturk, San Diego, CA (US);

Huichun Liu, Beijing, CN;

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 76/15 (2018.01); H04W 24/10 (2009.01); H04W 74/0833 (2024.01); H04W 76/19 (2018.01); H04W 76/20 (2018.01); H04W 76/30 (2018.01);
U.S. Cl.
CPC ...
H04W 76/15 (2018.02); H04W 24/10 (2013.01); H04W 74/0833 (2013.01); H04W 76/19 (2018.02); H04W 76/20 (2018.02); H04W 76/30 (2018.02);
Abstract

This disclosure provides systems, methods and apparatuses for early measurement associated with configuring with multiple secondary nodes (SNs). In one aspect, the configuration of multiple SNs may be improved by allowing a master node (MN) to determine a multi-SN configuration based at least in part on measurements of actual channel conditions as seen by the UE. Enabling the MN to receive the measurement information early during a process associated with establishing a connection between the UE and the MN may thereby improve efficiency and reduce latency associated with the configuration of multiple SNs.


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