The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 05, 2025

Filed:

Sep. 25, 2020
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Kiran Venugopal, Raritan, NJ (US);

Yan Zhou, San Diego, CA (US);

Tianyang Bai, Somerville, NJ (US);

Tao Luo, San Diego, CA (US);

Jung Ho Ryu, Fort Lee, NJ (US);

Junyi Li, Chester, NJ (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 7/00 (2006.01); H04B 7/08 (2006.01); H04L 5/00 (2006.01); H04W 24/08 (2009.01); H04W 72/53 (2023.01);
U.S. Cl.
CPC ...
H04B 7/088 (2013.01); H04L 5/005 (2013.01); H04W 24/08 (2013.01); H04W 72/53 (2023.01); H04L 5/001 (2013.01);
Abstract

Certain aspects of the present disclosure provide techniques for beam failure detection and recovery. A method that may be performed by a user equipment (UE) includes monitoring one or more reference signals for beam failure detection for a plurality of component carriers (CCs), detecting a beam failure for a subset of one or more CCs of the plurality of CCs based on the one or more reference signals, generating a beam failure recovery request (BFRQ) indicating that a beam failure has occurred for the plurality of CCs in response to the detection of the beam failure for the subset of one or more CCs, and transmitting the BFRQ.


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