The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 05, 2025

Filed:

Feb. 01, 2024
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventors:

Elie A Jreij, Pflugerville, TX (US);

Amihai Savir, Newton, MA (US);

Romulo Teixeira De Abreu Pinho, Niteroi, BR;

Peter Ziesmann, Spicewood, TX (US);

Rachel Shalom, Tel Aviv, IL;

Roberto Stelling, Rio de Janeiro, BR;

Aviv Zeilig, Rosh Haain, IL;

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04L 41/147 (2022.01); H04L 41/16 (2022.01); H04L 43/022 (2022.01);
U.S. Cl.
CPC ...
H04L 41/147 (2013.01); H04L 41/16 (2013.01); H04L 43/022 (2013.01);
Abstract

A system, method, and computer-readable medium for performing a data center management and monitoring operation to predict event failures, comprising taking time stamped telemetry metrics of data asset clusters; sampling the time stamped telemetry metrics; separating the sampled time stamped telemetry metrics into groups based on metric functionality; providing data of the groups into a residual neural network to learn patterns of the three groups; and concatenating output of the residual neural network of the groups, wherein concatenated output is feed back to the residual neural network to learn relationships of the three groups.


Find Patent Forward Citations

Jreij, Elie. (2025). Data center monitoring and management operation for data unavailable/data loss (du/dl) predictions, including service level agreement (sla) failure prediction (U.S. Patent No. 12381787). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12381787

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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