The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 05, 2025

Filed:

Mar. 10, 2022
Applicant:

Cisco Technology, Inc., San Jose, CA (US);

Inventors:

Vinay Kumar Kolar, San Jose, CA (US);

Jean-Philippe Vasseur, Saint Martin d'Uriage, FR;

Assignee:

Cisco Technology, Inc., San Jose, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 41/0631 (2022.01); H04L 41/16 (2022.01); H04L 41/5067 (2022.01); H04L 45/00 (2022.01);
U.S. Cl.
CPC ...
H04L 41/065 (2013.01); H04L 41/16 (2013.01); H04L 41/5067 (2013.01); H04L 45/46 (2013.01);
Abstract

In one embodiment, a device forms clusters of network paths via which traffic for an online application is conveyed by applying clustering to time series of quality of experience metrics for the online application. The device calculates, for a particular cluster of network paths among the clusters of network paths, correlation metrics between path features of those network paths of that cluster. The device selects, based on the correlation metrics, a particular path feature from among the path features as a root cause of poor quality of experience metrics for the online application along the network paths of the particular cluster of network paths. The device provides, to a user interface, an indication of the particular path feature as being the root cause of poor quality of experience metrics for the online application.


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