The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 05, 2025

Filed:

Nov. 08, 2022
Applicant:

South China University of Technology, Guangdong, CN;

Inventors:

Zhijian Chen, Guangdong, CN;

Bin Li, Guangdong, CN;

Guangyin Feng, Guangdong, CN;

Shan Gao, Guangdong, CN;

Zhaohui Wu, Guangdong, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03H 11/04 (2006.01); H03F 3/45 (2006.01); H03H 11/12 (2006.01);
U.S. Cl.
CPC ...
H03H 11/0472 (2013.01); H03F 3/45475 (2013.01); H03H 11/1204 (2013.01); H03F 2200/261 (2013.01); H03F 2200/375 (2013.01);
Abstract

A calibration method and a tuning method for an on-chip differential active RC filter are provided. The calibration method comprises: obtaining zero-crossing time of a differential signal outputted by a single-pole point real number filter by analyzing the single-pole point real number filter; setting a reference clock period according to the relationship between the zero-crossing time and the bandwidth of the single-pole point real number filter, and setting a calibration working time sequence according to the reference clock period; and scanning an RC configuration of an RC array according to the calibration working time sequence to realize calibration of the RC array.


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