The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 05, 2025

Filed:

Sep. 05, 2023
Applicant:

Moxtek, Inc., Orem, UT (US);

Inventors:

Kasey Otho Greenland, South Jordan, UT (US);

Michael S. Almond, Saratoga Springs, UT (US);

Todd S. Parker, Kaysville, UT (US);

Assignee:

Moxtek, Inc., Orem, UT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 35/18 (2006.01);
U.S. Cl.
CPC ...
H01J 35/186 (2019.05); H01J 2235/084 (2013.01); H01J 2235/086 (2013.01); H01J 2235/183 (2013.01);
Abstract

X-rays can be used for material identification. X-ray beam purity, target adhesion the x-ray window, and a robust hermetic seal of the x-ray window are useful. To achieve these objectives, a targetcan be mounted by an adhesion-layeron the x-ray window. The adhesion-layercan include chromium. A sealing-layercan seal the x-ray window to a flange. Material of the sealing-layercan be different from material of the adhesion-layer. There can be a gapbetween the flangeand the target. There can be a conductive-layeron the x-ray windowin the gap. A thickness Ts of the adhesion-layerbetween the sealing-layerand the x-ray windowcan be different than a thickness Tt of the adhesion-layerbetween the targetand the x-ray window


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