The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 05, 2025

Filed:

Jun. 11, 2023
Applicant:

Nuvoton Technology Corporation, Hsin-chu, TW;

Inventors:

Ziv Hershman, Givat Shmuel, IL;

Dana Agur, Herzliya, IL;

Alain Bismuth, Kibbutz Beth Rimon, IL;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 29/54 (2006.01); G06F 12/02 (2006.01);
U.S. Cl.
CPC ...
G11C 29/54 (2013.01); G06F 12/0238 (2013.01); G06F 2212/202 (2013.01);
Abstract

A method includes providing one or more signals to an electronic device for performing a test procedure that involves programming a One-Time Programmable (OTP) memory in the electronic device. A verification is made as to whether connection of the one or more signals to the electronic device is stable, by performing a sequence of one or more iterations, each iteration including (i) determining, from among a set of scratchpad addresses in the OTP memory, an address that is available for programming, (ii) writing a test value to the address, and then (iii) reading the test value from the address. If the read test value differs from the written test value, re-tuning of the connection of the one or more signals is initiated. Only when the connection is verified as stable by the sequence of iterations, the OTP memory is programmed in accordance with the test procedure.


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