The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2025
Filed:
Dec. 23, 2021
Hexagon Technology Center Gmbh, Heerbrugg, CH;
Bernhard Metzler, Dornbirn, AT;
Barbara Haupt, Walzenhausen, CH;
Markus Kächele, Walzenhausen, CH;
Bernd Reimann, Heerbrugg, CH;
Stefan Martin Benjamin Gächter Toya, St. Gallen, CH;
Alexandre Heili, Altstätten, CH;
HEXAGON TECHNOLOGY CENTER GMBH, Heerbrugg, CH;
Abstract
Systems and methods for surveillance of a facility including facility elements. The system includes a central computing unit providing a digital model of the facility providing topological or logical or functional relationships of the facility elements, surveillance sensors adapted for surveillance of a plurality of the facility elements and for generation of surveillance data, communication means for transmitting data from the surveillance sensors to the central computing unit, and state derivation means configured to analyse the surveillance data and derive a state of a respective facility element. The central computing unit is configured to record a state pattern by combining states of at least one facility element based on at least one relationship of the facility element provided by the facility model, provide a state pattern critical-noncritical classification model which considers relationships provided by the facility model, and perform a criticality-classification based on the relationship.