The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 05, 2025

Filed:

Sep. 10, 2020
Applicant:

Sony Group Corporation, Tokyo, JP;

Inventor:

Florian Becker, Stuttgart, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G06T 7/246 (2017.01); G06T 7/73 (2017.01); G06V 10/77 (2022.01); G06V 10/776 (2022.01); G06V 10/80 (2022.01); G06V 20/00 (2022.01);
U.S. Cl.
CPC ...
G06V 20/00 (2022.01); G06T 7/246 (2017.01); G06T 7/74 (2017.01); G06V 10/7715 (2022.01); G06V 10/776 (2022.01); G06V 10/806 (2022.01); G06T 2207/10028 (2013.01); G06T 2207/10044 (2013.01); G06T 2207/20081 (2013.01); G06V 2201/07 (2022.01);
Abstract

The present disclosure generally pertains to an object detection circuitry configured to: obtain first feature data which are based on first sensing data of a first sensor; compare the first feature data to a first predetermined feature model being representative of a predefined object, wherein the first predetermined feature model is specific for the first sensor, thereby generating first object probability data; obtain second feature data which are based on second sensing data of a second sensor; compare the second feature data to a second predetermined feature model being representative of the predefined object, wherein the second predetermined feature model is specific for the second sensor, thereby generating second object probability data; and combine the first and the second object probability data, thereby generating combined probability data for detecting the predefined object.


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