The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 05, 2025

Filed:

Dec. 16, 2021
Applicant:

Huawei Technologies Co., Ltd., Guangdong, CN;

Inventors:

Hang Xu, Hong Kong, CN;

Zhenguo Li, Hong Kong, CN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06V 10/82 (2022.01); G06N 3/08 (2023.01); G06N 5/02 (2023.01); G06V 10/764 (2022.01); G06V 10/77 (2022.01);
U.S. Cl.
CPC ...
G06V 10/82 (2022.01); G06N 3/08 (2013.01); G06N 5/02 (2013.01); G06V 10/764 (2022.01); G06V 10/7715 (2022.01);
Abstract

This application provides example object detection methods and apparatuses. This application relates to the field of artificial intelligence, and specifically, to the field of computer vision. One example method includes obtaining a to-be-detected image and performing convolution processing on the to-be-detected image to obtain an initial image feature of a to-be-detected object in the to-be-detected image. Based on knowledge graph information, an enhanced image feature of the to-be-detected object is determined. A candidate frame and a classification of the to-be-detected object is determined based on the initial image feature and the enhanced image feature of the to-be-detected object. The enhanced image feature indicates semantic information of a different object category corresponding to another object associated with the to-be-detected object.


Find Patent Forward Citations

Loading…