The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2025
Filed:
Dec. 18, 2021
Applicant:
Texas Instruments Incorporated, Dallas, TX (US);
Inventors:
Soyeb Noormohammed Nagori, Bangalore, IN;
Manu Mathew, Bangalore, IN;
Debapriya Maji, Bangalore, IN;
Pramod Kumar Swami, Bangalore, IN;
Assignee:
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06V 10/774 (2022.01); G06N 3/082 (2023.01); G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
G06V 10/7747 (2022.01); G06N 3/082 (2013.01); G06V 10/82 (2022.01);
Abstract
A method for multi-label image classification in a convolutional neural network (CNN) is provided that includes forming a composite image from a plurality of clipped images, and processing the composite image by the CNN to generate a probability vector for each clipped image of the plurality of clipped images, wherein a length of a probability vector is equal to a number of classes the CNN is designed to classify.