The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 05, 2025

Filed:

Aug. 19, 2020
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Kenta Ishihara, Tokyo, JP;

Shoji Nishimura, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G06F 18/213 (2023.01); G06T 7/20 (2017.01); G06T 7/70 (2017.01); G06V 10/42 (2022.01); G06V 10/44 (2022.01); G06V 10/46 (2022.01); G06V 10/70 (2022.01); G06V 10/74 (2022.01); G06V 10/762 (2022.01); G06V 10/77 (2022.01); G06V 20/52 (2022.01); G06V 20/56 (2022.01); G08B 21/04 (2006.01);
U.S. Cl.
CPC ...
G06V 10/44 (2022.01); G06F 18/213 (2023.01); G06T 7/20 (2013.01); G06T 7/70 (2017.01); G06V 10/42 (2022.01); G06V 10/467 (2022.01); G06V 10/74 (2022.01); G06V 10/761 (2022.01); G06V 10/762 (2022.01); G06V 10/768 (2022.01); G06V 10/7715 (2022.01); G06V 20/52 (2022.01); G06V 20/56 (2022.01); G08B 21/0423 (2013.01); G06T 2207/30232 (2013.01); G06T 2207/30242 (2013.01); G06T 2207/30252 (2013.01);
Abstract

A reference state deciding device () according to the present disclosure includes a feature calculation unit () that calculates an object feature related to a target object of state determination included in a real space and an imaged space feature related to the real space on the basis of past image data of the real space imaged in the past and target image data of the real space imaged at the time of the state determination, and a reference state deciding unit () that decides a reference state to be used for the state determination on the basis of a relation between the object feature and the imaged space feature calculated from the past image data and the target image data.


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