The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 05, 2025

Filed:

Oct. 24, 2023
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Fang Lu, Billerica, MA (US);

Tushar Agrawal, West Fargo, ND (US);

Sarbajit K. Rakshit, Kolkata, IN;

Jeremy R. Fox, Georgetown, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 19/00 (2011.01); G06V 10/25 (2022.01); G06V 10/764 (2022.01);
U.S. Cl.
CPC ...
G06T 19/006 (2013.01); G06V 10/25 (2022.01); G06V 10/764 (2022.01); G06V 2201/07 (2022.01);
Abstract

A digital model is generated of a debris location where the digital model includes an augmented reality overlay of the debris location. Digital data from sensors at a debris field is received at a computer, and the digital data depicts debris in the debris field. Materials in the debris field are detected and identified based on the detected materials in the debris field. Layers of materials in the debris field are identified. A digital model is generated of the materials in the debris field including in the layers. Using the computer and an augmented reality (AR) device, an augmented reality overlay is generated based on the digital model of the materials in the debris fields. The augmented reality overlay is superimposed over the digital model of the materials in the debris field to indicate the materials in the debris field and the materials in the layers of the debris field.


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