The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 05, 2025

Filed:

Nov. 10, 2021
Applicant:

Inait SA, Lausanne, CH;

Inventors:

Daniel Milan Lütgehetmann, Lausanne, CH;

Dimitri Zaganidis, Granges, CH;

Nicolas Alain Berger, Fribourg, CH;

Felix Schürmann, Grens, CH;

Assignee:

INAIT SA, Lausanne, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G06T 7/73 (2017.01); H04N 23/60 (2023.01);
U.S. Cl.
CPC ...
G06T 7/75 (2017.01); G06T 7/74 (2017.01); H04N 23/64 (2023.01); G06T 2207/30244 (2013.01);
Abstract

A method for characterizing correctness of image processing includes receiving images of an instance of an object, wherein the images were acquired at different relative poses, identifying positions of corresponding landmarks on the object in each of the received images, receiving information characterizing a difference in position or a difference in orientation of at least one of the instance of the object and one or more imaging devices when the images were acquired, transferring the positions of landmarks identified in a first of the images based on the difference in position or the difference in orientation, and comparing the positions of the transferred landmarks with the positions of the corresponding of the landmarks identified in a second of the received images, and characterizing a correctness of the identification of the positions of the landmarks in at least one of the received images.


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