The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 05, 2025

Filed:

Dec. 09, 2022
Applicant:

Zoox, Inc., Foster City, CA (US);

Inventors:

Yongzhe Chen, San Jose, CA (US);

Venkata Subrahmanyam Chandra Sekhar Chebiyyam, San Francisco, CA (US);

Samuel Russell Holladay, San Francisco, CA (US);

Robert Nicholas Moor, San Mateo, CA (US);

Jonathan Solheim, Santa Clara, CA (US);

Shaminda Subasingha, San Ramon, CA (US);

Wuyang Yu, Sunnyvale, CA (US);

Assignee:

Zoox, Inc., Foster City, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/55 (2017.01); B60R 11/00 (2006.01); B60W 60/00 (2020.01); G01S 7/4865 (2020.01); G01S 7/4915 (2020.01); G01S 17/89 (2020.01); G06T 7/521 (2017.01);
U.S. Cl.
CPC ...
G06T 7/55 (2017.01); B60R 11/00 (2013.01); G01S 7/4865 (2013.01); G01S 7/4915 (2013.01); G01S 17/89 (2013.01); G06T 7/521 (2017.01); B60W 60/001 (2020.02); G06T 2207/10028 (2013.01); G06T 2207/10144 (2013.01); G06T 2207/20212 (2013.01); G06T 2207/30241 (2013.01); G06T 2207/30252 (2013.01);
Abstract

Sensors, including time-of-flight sensors, may be used to detect objects in an environment. In an example, a vehicle may include a time-of-flight sensor that images objects around the vehicle, e.g., so the vehicle can navigate relative to the objects. Composite sensor data can be generated based on information from multiple exposures captured at different exposure times. In examples, a first depth determination technique is applied to a first subset of pixels and a second depth determination technique is applied to a second subset of the pixels. The first subset of pixels may correspond to pixels that are associated with a highly-reflective surface.


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