The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2025
Filed:
Oct. 22, 2024
Veytel, Inc., Pittsburgh, PA (US);
Paul H. Haley, Easton, PA (US);
Ellen K. Hughes, Pittsburgh, PA (US);
Michael Hoffelder, Norwich, NY (US);
Catherine M. Dietz, Redmond, WA (US);
Kevin J. Mitchell, Altoona, PA (US);
Veytel, Inc., Pittsburgh, PA (US);
Abstract
A system, method, and computer program product for registering two or more patient images for change assessment over time. An example aspect is configured to: obtain a new image of an area with an image capture system; obtain a reference image of a similar area; perform pre-processing of the new image and the reference image; perform a coarse alignment of the new image and the reference image; perform a high-resolution estimate; perform a high-resolution alignment; cross-check the at least one-point match to eliminate false matches and confirm correct matches of the high-resolution new image and the high-resolution reference image; perform segmentation of the high-resolution new image and the high-resolution reference image; perform analysis on at least one lesion in the high-resolution new image and the high-resolution reference image; and display a result of the analysis on a validator.