The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2025
Filed:
Apr. 28, 2022
Shanghai United Imaging Healthcare Co., Ltd., Shanghai, CN;
Yang Xin, Shanghai, CN;
Yuhang Shi, Shanghai, CN;
Guobin Li, Shanghai, CN;
Lixiang Hu, Shanghai, CN;
Yanxia Chen, Shanghai, CN;
SHANGHAI UNITED IMAGING HEALTHCARE CO., LTD., Shanghai, CN;
Abstract
A method may include obtaining an image of an object; obtaining a target artifact identification model; determining target artifact feature information by inputting the image into the target artifact identification model, the target artifact feature information indicating a feature of one or more artifacts in the image; obtaining a target artifact extent determination model; determining target artifact extent indication information by inputting the image and the target artifact feature information into the target artifact extent determination model, the target artifact extent indication information indicating an influence extent of the one or more artifacts on an image quality of the image; in response to determining that the influence extent is greater than or equal to the extent threshold, outputting a notice of the one or more artifacts of the image.