The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2025
Filed:
Sep. 07, 2021
Peernova, Inc., San Jose, CA (US);
Kartik Gupta, New York, NY (US);
Gangesh Kumar Ganesan, Half Moon Bay, CA (US);
Erika Aine Lunceford, Belmont, CA (US);
PeerNova, Inc., San Jose, CA (US);
Abstract
A prediction consensus system receives predicted event values for an event. The predicted event values are generated by various computer models that may have different training schemes and input data. The prediction consensus system generates a consensus value based on the predicted event values after excluding outliers. Outliers are determined among the predicted event values based on statistical measures of the predicted event values as well as observed event values. The predicted event values that appear to be outliers based on the predicted statistical measures may nonetheless be included when they are within the observed statistical measures. This ensures the predicted event values used in the consensus values are not unduly biased towards other predicted event values. Similarly, the identification of event values as accepted or an outlier may be returned as training data for retraining the computer models that generated the predicted event values.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile