The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 05, 2025

Filed:

Mar. 04, 2024
Applicant:

Ecosystem Informatics Inc., Mississauga, CA;

Inventors:

Shirook Ali, Milton, CA;

Mohamed Bakr, Hamilton, CA;

Assignee:

Ecosystem Informatics Inc., Mississauga, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06N 3/08 (2023.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01);
Abstract

Embodiments herein generally relate to methods and systems for using a forward calibration model to generate calibrated values for ambient parameters. In at least one example, the method for calibrating a measured un-calibrated ambient parameter (AP) value, includes generating, using an optimization model, a predicted calibrated AP value corresponding to the un-calibrated ambient parameter (AP); inputting, into a trained forward calibration model: (i) the predicted calibrated AP value; and (ii) one or more accuracy-enhancing parameters; generating, using the trained forward calibration model, a predicted un-calibrated AP value; determining if an error difference between the predicted un-calibrated AP value and measured un-calibrated ambient parameter (AP) value, is below a pre-determined threshold; if not, using the optimization model, to generate an updated predicted calibrated AP value and iterating the method, and otherwise outputting the predicted calibrated AP value, as the calibrated AP value.


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